Project Details
Description
Projecting and application of physical and chemical preparation techniques for electron microscopic investigations; evaporation and sputtering techniques, gas discharge techniques, coating of temperature sensitive specimen, low-temperature preparation, thinning of various materials, structure developments for metallographic investigations, fabrication of thin layers, preparation of thin specimens using a focused ion beam instrument
Status | Finished |
---|---|
Effective start/end date | 1/01/95 → 31/01/03 |
Fingerprint
Explore the research topics touched on by this project. These labels are generated based on the underlying awards/grants. Together they form a unique fingerprint.