20V-high speed low cost arbitrary waveform generator for ICs immunity test

Xu Gao; Tianqi Li; Nicholas Bennett Mentesana; Zhenwei Yu; Aleksandr Yakubovich Gafarov; Liehui Ren; Hongyu An; David Pommerenke

doi:10.1109/ISEMC.2011.6038426

20V-high speed low cost arbitrary waveform generator for ICs immunity test

Xu Gao^*, Tianqi Li, Nicholas Bennett Mentesana, Zhenwei Yu, Aleksandr Yakubovich Gafarov, Liehui Ren, Hongyu An, David Pommerenke

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

A 30V high speed, low resolution and low cost arbitrary waveform generator has been prototyped. It uses FPGA transceivers and resistive weighting networks and broadband power amplification. The sampling rate of this arbitrary waveform generator is 6.25 Gsps, allowing rise times down to 130 ps. As 4 transceiver channels are used a 4 bit resolution is achieved. The generator is combined with a wide band (20MHz-6 GHz) power amplifier allowing 20V at 50-Ohm load. The intended application is IC immunity testing. Here different waveforms and exact timing is needed. Using different FPGAs the concept can be extended to higher resolution and faster sampling rates. The project was completed in a 400 level RF design class during only one semester.

Original language	English
Title of host publication	EMC 2011 - Proceedings
Subtitle of host publication	2011 IEEE International Symposium on Electromagnetic Compatibility
Pages	846-849
Number of pages	4
DOIs	https://doi.org/10.1109/ISEMC.2011.6038426
Publication status	Published - 24 Oct 2011
Externally published	Yes
Event	2011 IEEE International Symposium on Electromagnetic Compatibility: EMC 2011 - Long Beach, United States Duration: 14 Aug 2011 → 19 Aug 2011

Publication series

Name	IEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)	1077-4076

Conference

Conference	2011 IEEE International Symposium on Electromagnetic Compatibility
Country/Territory	United States
City	Long Beach
Period	14/08/11 → 19/08/11

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/ISEMC.2011.6038426

Cite this

Gao, X., Li, T., Mentesana, N. B., Yu, Z., Gafarov, A. Y., Ren, L., An, H., & Pommerenke, D. (2011). 20V-high speed low cost arbitrary waveform generator for ICs immunity test. In EMC 2011 - Proceedings: 2011 IEEE International Symposium on Electromagnetic Compatibility (pp. 846-849). Article 6038426 (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/ISEMC.2011.6038426

20V-high speed low cost arbitrary waveform generator for ICs immunity test. / Gao, Xu; Li, Tianqi; Mentesana, Nicholas Bennett et al.
EMC 2011 - Proceedings: 2011 IEEE International Symposium on Electromagnetic Compatibility. 2011. p. 846-849 6038426 (IEEE International Symposium on Electromagnetic Compatibility).

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Gao, X, Li, T, Mentesana, NB, Yu, Z, Gafarov, AY, Ren, L, An, H & Pommerenke, D 2011, 20V-high speed low cost arbitrary waveform generator for ICs immunity test. in EMC 2011 - Proceedings: 2011 IEEE International Symposium on Electromagnetic Compatibility., 6038426, IEEE International Symposium on Electromagnetic Compatibility, pp. 846-849, 2011 IEEE International Symposium on Electromagnetic Compatibility, Long Beach, California, United States, 14/08/11. https://doi.org/10.1109/ISEMC.2011.6038426

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20V-high speed low cost arbitrary waveform generator for ICs immunity test

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