Original language | English |
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Pages (from-to) | 591-605 |
Journal | COMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering |
Volume | 24 |
Issue number | 2 |
Publication status | Published - 2005 |
A FEM-BEM approach using level-sets in electrical capacitance tomography
Bernhard Kortschak, Bernhard Brandstätter
Research output: Contribution to journal › Article › peer-review