A Novel Test Method for Switching Loss Measurement of Reverse-Blocking Semiconductor Switches in Current-Source Inverters

This paper presents a novel test method for measuring the switching losses of current-source inverters (CSIs). The double-pulse test cell for CSIs, already described in several literature sources, is extended by a third semiconductor switch for better replication of the final device layout of the full-scale converter and the associated parasitic characteristics. By using a voltage source instead of a current source, and by modifying the timing of the double pulse, a continuous flow of DC-link current through the circuit before and after the test is avoided. This allows the switching loss measurement to be performed at higher currents without the need for additional cooling of the power semiconductors during early design stages, which would otherwise heat up due to conduction losses. This also helps to prevent asymmetric temperature distribution across the switching devices.