A systematic method for determining soft-failure robustness of a subsystem

Benjamin Orr, Pratik Maheshwari, Harald Gossner, David Pommerenke, Wolfgang Stadler

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review


A systematic method for evaluating soft fail robustness of a DUT subsystem is presented and demonstrated on a camera MIPI interface. Two different mobile phone platforms are studied under TLP injection while various methods for extracting failure thresholds and localization are applied. The root cause for the soft-failure threshold discrepancy is left for future work.

Original languageEnglish
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013
Publication statusPublished - 16 Oct 2013
Externally publishedYes
Event35th Annual Electrical Overstress/Electrostatic Discharge Symposium: EOS/ESD 2013 - Las Vegas, United States
Duration: 8 Sept 201313 Sept 2013

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
ISSN (Print)0739-5159


Conference35th Annual Electrical Overstress/Electrostatic Discharge Symposium
Country/TerritoryUnited States
CityLas Vegas

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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