A Thru-Free Multiline Calibration

Ziad Hatab*, Michael Ernst Gadringer, Wolfgang Bösch

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

This article proposes a modification to the traditional multiline thru-reflect-line (TRL) or line-reflect-line (LRL) calibration method used for vector network analyzers (VNAs). Our proposed method eliminates the need for a thru (or line) standard by using an arbitrary transmissive two-port device in combination with an additional reflect standard. This combination of standards allows us to arbitrarily set the location of the calibration plane using physical artifacts. In contrast to the standard multiline TRL method, the suggested approach avoids a postprocessing step to shift the calibration plane if a line standard is used. We demonstrate our proposed method with measurements on a printed circuit board (PCB) and compare it to the multiline TRL method with a perfectly defined thru.
Original languageEnglish
Article number1008709
Pages (from-to)1-9
Number of pages9
JournalIEEE Transactions on Instrumentation and Measurement
Volume72
DOIs
Publication statusPublished - 1 Jan 2023

Keywords

  • Standards
  • Calibration
  • Mathematical models
  • Measurement uncertainty
  • Eigenvalues and eigenfunctions
  • Propagation constant
  • Reflection
  • microwave measurement
  • vector network analyzer (VNA)
  • metrology
  • millimeter-wave

ASJC Scopus subject areas

  • Instrumentation
  • Electrical and Electronic Engineering

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Experimental

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