Projects per year
Abstract
This article proposes a modification to the traditional multiline thru-reflect-line (TRL) or line-reflect-line (LRL) calibration method used for vector network analyzers (VNAs). Our proposed method eliminates the need for a thru (or line) standard by using an arbitrary transmissive two-port device in combination with an additional reflect standard. This combination of standards allows us to arbitrarily set the location of the calibration plane using physical artifacts. In contrast to the standard multiline TRL method, the suggested approach avoids a postprocessing step to shift the calibration plane if a line standard is used. We demonstrate our proposed method with measurements on a printed circuit board (PCB) and compare it to the multiline TRL method with a perfectly defined thru.
Original language | English |
---|---|
Article number | 1008709 |
Pages (from-to) | 1-9 |
Number of pages | 9 |
Journal | IEEE Transactions on Instrumentation and Measurement |
Volume | 72 |
DOIs | |
Publication status | Published - 1 Jan 2023 |
Keywords
- Standards
- Calibration
- Mathematical models
- Measurement uncertainty
- Eigenvalues and eigenfunctions
- Propagation constant
- Reflection
- microwave measurement
- vector network analyzer (VNA)
- metrology
- millimeter-wave
ASJC Scopus subject areas
- Instrumentation
- Electrical and Electronic Engineering
Fields of Expertise
- Information, Communication & Computing
Treatment code (Nähere Zuordnung)
- Experimental
Fingerprint
Dive into the research topics of 'A Thru-Free Multiline Calibration'. Together they form a unique fingerprint.Projects
- 1 Active
-
CD-Laboratory for Technology guided electronic component design and characterization
Bösch, W., Hatab, Z., Gadringer, M. E., Takahashi, H., Maier, C., Sarbandi Farahani, H., Pauser, C., Paulitsch, H., Rezaee, B. & Fuchs, M.
1/11/20 → 31/10/27
Project: Research project