AFM, ellipsometry, XPS and TEM on ultra-thin oxide/polymer nanocomposite layers in organic thin film transistors

Alexander Fian, Anja Haase, Barbara Stadelober, Georg Jakopic, Nadezda Matsko, Werner Grogger, Günther Leising

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1455-1461
Journal	Analytical and Bioanalytical Chemistry
Volume	390
Issue number	6
DOIs	https://doi.org/10.1007/s00216-007-1663-7
Publication status	Published - 2008

Treatment code (Nähere Zuordnung)

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title = "AFM, ellipsometry, XPS and TEM on ultra-thin oxide/polymer nanocomposite layers in organic thin film transistors",

author = "Alexander Fian and Anja Haase and Barbara Stadelober and Georg Jakopic and Nadezda Matsko and Werner Grogger and G{\"u}nther Leising",

year = "2008",

doi = "10.1007/s00216-007-1663-7",

language = "English",

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pages = "1455--1461",

journal = "Analytical and Bioanalytical Chemistry",

issn = "1618-2650 ",

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TY - JOUR

T1 - AFM, ellipsometry, XPS and TEM on ultra-thin oxide/polymer nanocomposite layers in organic thin film transistors

AU - Fian, Alexander

AU - Haase, Anja

AU - Stadelober, Barbara

AU - Jakopic, Georg

AU - Matsko, Nadezda

AU - Grogger, Werner

AU - Leising, Günther

PY - 2008

Y1 - 2008

U2 - 10.1007/s00216-007-1663-7

DO - 10.1007/s00216-007-1663-7

M3 - Article

SN - 1618-2650

VL - 390

SP - 1455

EP - 1461

JO - Analytical and Bioanalytical Chemistry

JF - Analytical and Bioanalytical Chemistry

IS - 6

ER -