Analysis of Submicron Particles by Scanning Electron Microscopy-Energy-Dispersive X-ray Spectrometry—Accuracy of Size Measurement

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@article{9ff592313370411a93d89ba5bb211f30,

title = "Analysis of Submicron Particles by Scanning Electron Microscopy-Energy-Dispersive X-ray Spectrometry—Accuracy of Size Measurement",

author = "Stefan Mitsche and Peter P{\"o}lt and Julian Wagner",

year = "2006",

language = "English",

volume = "28",

pages = "282--288",

journal = "Scanning",

issn = "0161-0457",

publisher = "John Wiley and Sons Inc.",

}