This work is situated in the research field of organic electronics. The aim is the ability to investigate organic electronic devices in the Transmission Electron Microscope (TEM) supporting the development and improvement of the manufacturing process. The challenges are the sample preparation and the characterization via TEM due to the lack of distinguishing features of the used materials. In this work advanced analytical methods for the investigation of organic devices in the TEM are presented.
|Journal||Imaging & Microscopy|
|Publication status||Published - 2014|
Fields of Expertise
- Advanced Materials Science
Treatment code (Nähere Zuordnung)
- Basic - Fundamental (Grundlagenforschung)