Soft X-ray tomography has become a standard diagnostic equipment to investigate plasma profiles. Due to limitations in viewing-access and detector numbers the reconstruction of the two-dimensional emissivity profile constitutes a highly underdetermined inversion problem. We discuss the principle features of the tomography problem from the Bayesian point of view in various stages of sophistication. The approach is applied to real-world data obtained from the Wendelstein 7AS stellerator.
|Title of host publication
|Maximum Entropy and Bayesian Methods
|John Skilling, Sibusiso Sibisi
|Number of pages
|Published - 1996
|Fundamental Theories of Physics
- Analytical Chemistry, Probability Theory and Stochastic Processes, Statistical Physics, Dynamical Systems and Complexity, Statistics for Engineering, Physics, Computer Science, Chemistry and Earth Sciences