@inproceedings{6681d030d1a04b9c938156ba94eaf862,
title = "Effects of TVS integration on system level ESD robustness",
abstract = "Higher integration of Transient Voltage Suppression (TVS) functionality into ASIC I/O cells implies lower system costs. But as the ESD pulse is directed deeper into the system, migrating the TVS clamping function from the periphery of the system to a central ASIC may actually reduce the system's ESD robustness. ESD current reconstruction scanning can be used to trace the current path on a PCB, and possibly within an IC. The article compares the current spreading during and ESD for different ESD protection methods.",
author = "Wei Huang and Jeffrey Dunnihoo and David Pommerenke",
year = "2010",
month = dec,
day = "24",
language = "English",
isbn = "1585371823",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010, EOS/ESD 2010",
note = "32nd Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2010 ; Conference date: 03-10-2010 Through 08-10-2010",
}