EFTEM and EELS analysis of a Pt/NiO interface

Werner Grogger, Ferdinand Hofer*, Bernd Kraus, Irmgard Rom, Werner Sitte, Peter Warbichler

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


Energy-filtering transmission electron microscopy (EFTEM) is more and more becoming an important nanoanalytical technique in both materials science and biology. The main advantage of the method lies in the possibility to obtain two-dimensional chemical information from large specimen areas as well as from features on a nanometer scale. Due to its excellent lateral resolution it is perfectly suited for the investigation of nanometer sized features (e.g. interfaces). In this paper we will show how EFTEM can be used to characterize the interface between a Pt layer and a NiO crystal as part of a coulometric titration cell. In addition to elemental distribution maps electron energy-loss spectra (EELS) across the interface (EELS linescans) have been acquired to obtain quantitative compositional profiles. By employing these methods the following interfacial layers could be identified, all of which containing Pt, Ni and O in different proportions: 13 nm Pt-rich, 32 nm Ni-rich and 29 nm Pt-rich. The origin of these is discussed in terms of displacement reactions.

Original languageEnglish
Pages (from-to)125-129
Number of pages5
JournalMicrochimica Acta
Issue number1-4
Publication statusPublished - 1 Jan 2000


  • Analytical electron microscopy
  • EELS
  • Energy-filtering TEM
  • Pt/NiO interface

ASJC Scopus subject areas

  • Analytical Chemistry


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