Energy-filtering transmission electron microscopy (EFTEM) is more and more becoming an important nanoanalytical technique in both materials science and biology. The main advantage of the method lies in the possibility to obtain two-dimensional chemical information from large specimen areas as well as from features on a nanometer scale. Due to its excellent lateral resolution it is perfectly suited for the investigation of nanometer sized features (e.g. interfaces). In this paper we will show how EFTEM can be used to characterize the interface between a Pt layer and a NiO crystal as part of a coulometric titration cell. In addition to elemental distribution maps electron energy-loss spectra (EELS) across the interface (EELS linescans) have been acquired to obtain quantitative compositional profiles. By employing these methods the following interfacial layers could be identified, all of which containing Pt, Ni and O in different proportions: 13 nm Pt-rich, 32 nm Ni-rich and 29 nm Pt-rich. The origin of these is discussed in terms of displacement reactions.
|Number of pages||5|
|Publication status||Published - 1 Jan 2000|
- Analytical electron microscopy
- Energy-filtering TEM
- Pt/NiO interface
ASJC Scopus subject areas
- Analytical Chemistry