EFTEM-the ultimate tool for the characterization of nanoparticles and nanolayers

Mario Schmied, Ferdinand Hofer, Ilse Letofsky-Papst, Irmgard Rom

Research output: Contribution to conference › Poster

Original languageEnglish
Publication statusPublished - 1999
EventWorkshop SMARTON - Bad Loipersdorf
Duration: 25 Sept 1999 → 28 Sept 1999

Conference

ConferenceWorkshop SMARTON
CityBad Loipersdorf
Period25/09/99 → 28/09/99

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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