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Electric-field-resolved near-infrared microscopy
Mikhail Mamaikin, Yik-Long Li, Enrico Ridente, Wei Ting Chen, Joon-Suh Park, Alexander Y. Zhu, Federico Capasso, Matthew Weidman, Martin Schultze, Ferenc Krausz, Nicholas Karpowicz*
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review