Estimate on the uncertainty of predicting radiated emission from near-field scan caused by insufficient or inaccurate near-field data: Evaluation of the needed step size, phase accuracy and the need for all surfaces in the Huygens' box

Morten Sorensen*, Ondrej Franek, Gert Frølund Pedersen, Andriy Radchenko, Keong Kam, David Pommerenke

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review


Near-field scan on a Huygens' box can be used in order to predict the maximal radiated emission from a Printed Circuit Board. The significance of step size and phase accuracy, and the importance of a full Huygens' box are investigated by simulation of two different models with two different numerical methods. The prediction of maximal radiated emission is quite robust but the results also show that a full scan on all six surfaces is probably needed.

Original languageEnglish
Title of host publicationEMC EUROPE 2012 - International Symposium on Electromagnetic Compatibility, Proceedings
Publication statusPublished - 1 Dec 2012
Externally publishedYes
EventInternational Symposium on Electromagnetic Compatibility: EMC EUROPE 2012 - Rome, Italy
Duration: 17 Sept 201221 Sept 2012

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118


ConferenceInternational Symposium on Electromagnetic Compatibility


  • Huygens' box
  • near-field scan
  • predicting radiated emission
  • simulation

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this