Experimental characterization and methodology for full-wave modeling of ESD to displays

Hossein Rezaei, Zhekun Peng, Shubhankar Marathe, David Johannes Pommerenke, Lam Cheung-Wei Lam, Ali Foudazi, Daryl G. Beetner, DongHyun Kim

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review


An electrostatic discharge (ESD) to the touchscreen display of a cellphone or other handheld device can result in device failures through sparkless discharge. A test model has been designed and a test board built to investigate sparkless discharge to glass displays, based on the discharge path in a typical product. The current waveform at the touchscreen circuit load was captured during an air discharge using an oscilloscope for 40 test cases with different glass thicknesses, load resistances, and patch-to-ground capacitances. Full wave and circuit models of the discharge event have also been developed. Using the circuit model and a genetic algorithm approach, methods were developed for estimating the input current waveform associated with the discharge event. Using this current waveform, it is possible to predict the magnitude, rise time, total charge, and energy of a typical surface discharges to displays during the early stages of product design to prevent device failures
Original languageEnglish
Title of host publication2020 IEEE International Symposium on Electromagnetic Compatibility and Signal/Power Integrity, EMCSI 2020
Number of pages6
ISBN (Electronic)978-1-7281-7430-3
Publication statusPublished - Jul 2020
Event2020 IEEE International Symposium on Electromagnetic Compatibility and Signal/Power Integrity: EMCSI 2020 - Virtual, Reno, United States
Duration: 27 Jul 202031 Jul 2020


Conference2020 IEEE International Symposium on Electromagnetic Compatibility and Signal/Power Integrity
Abbreviated titleEMCSI 2020
Country/TerritoryUnited States
CityVirtual, Reno


  • displacement current
  • display
  • Electrostatic discharge
  • genetic algorithm
  • modeling
  • sparkless discharge
  • surface discharge

ASJC Scopus subject areas

  • Information Systems and Management
  • Safety, Risk, Reliability and Quality
  • Signal Processing
  • Radiation
  • Electrical and Electronic Engineering

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