FEM-Based Computation of Circuit Parameters for Testing Fast Transients for EMC Problems

Susanne Bauer; Werner Renhart; Oszkár Bíró

doi:10.1109/TMAG.2017.2651171

FEM-Based Computation of Circuit Parameters for Testing Fast Transients for EMC Problems

Susanne Bauer^*, Werner Renhart, Oszkár Bíró

^*Corresponding author for this work

Institute of Fundamentals and Theory in Electrical Engineering (4370)

Research output: Contribution to journal › Article › peer-review

Abstract

To test the immunity of an electronic devices against electrical fast transient pulses, the standardized electromagnetic compatibility measurement setup of the capacitive coupling clamp has been utilized. This paper outlines the extraction of circuit parameters with finite elements for this standardized setup. The obtained circuit parameters can be used for time saving simulations with quite common circuit simulators like LTSPICE. The simulated results are in good agreement with the measured output.

Original language	English
Article number	7812785
Journal	IEEE Transactions on Magnetics
Volume	53
Issue number	6
DOIs	https://doi.org/10.1109/TMAG.2017.2651171
Publication status	Published - 1 Jun 2017

Keywords

Eddy currents
electromagnetic compatibility (EMC)
electrostatics
FEM

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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10.1109/TMAG.2017.2651171

Cite this

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abstract = "To test the immunity of an electronic devices against electrical fast transient pulses, the standardized electromagnetic compatibility measurement setup of the capacitive coupling clamp has been utilized. This paper outlines the extraction of circuit parameters with finite elements for this standardized setup. The obtained circuit parameters can be used for time saving simulations with quite common circuit simulators like LTSPICE. The simulated results are in good agreement with the measured output.",

keywords = "Eddy currents, electromagnetic compatibility (EMC), electrostatics, FEM",

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AB - To test the immunity of an electronic devices against electrical fast transient pulses, the standardized electromagnetic compatibility measurement setup of the capacitive coupling clamp has been utilized. This paper outlines the extraction of circuit parameters with finite elements for this standardized setup. The obtained circuit parameters can be used for time saving simulations with quite common circuit simulators like LTSPICE. The simulated results are in good agreement with the measured output.

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KW - electromagnetic compatibility (EMC)

KW - electrostatics

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FEM-Based Computation of Circuit Parameters for Testing Fast Transients for EMC Problems

Abstract

Keywords

ASJC Scopus subject areas

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