High-resolution and energy-filtered transmission electron microscopy of YBa2Cu3O7-x/PrBa2Cu3 O7 superlattices

M. Varela, C. Ballesteros*, W. Grogger, K. M. Krishnan, D. Arias, Z. Sefrioui, C. León, J. Santamaría

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review


Structural disorder induced by epitaxial strain relaxation in c-axis oriented [YBa2Cu3O7-x n u.c/PrBa2Cu3O7 5 u.c.] superlattices on (100) SrTiO3 substrates has been analyzed by high-resolution and energy-filtered transmission electron microscopy. Epitaxial strain shows up in ultrathin YBCO layers with thickness below 4 unit cells. Strain relaxation takes place when layer thickness increases above this value. Microscopy observations for epitaxially strained superlattices show a good morphology of the layers, with sharp and flat interfaces. However, in relaxed samples rougher interfaces are observed, together with microdomains showing the c-axis parallel to the substrate plane which preserve the superlattice compositional profile. Such microdomains of c-parallel growth provide a path for reduced lattice mismatch, conforming a very efficient mechanism for strain relaxation.

Original languageEnglish
Pages (from-to)558-561
Number of pages4
JournalJournal of Alloys and Compounds
Publication statusPublished - 12 Jul 2001
Externally publishedYes
Event4th International Conference on f-Elements - Madrid, Spain
Duration: 17 Sept 200021 Sept 2000


  • A. high-Tc superconductors
  • A. thin films
  • C. scanning and transmission electron microscopy

ASJC Scopus subject areas

  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

Cite this