High resolution X-ray diffraction studies on hexaphenyl thin films

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@article{13b4d00e5d7448ac86169a0648687dd6,

title = "High resolution X-ray diffraction studies on hexaphenyl thin films",

author = "Roland Resel and G{\"u}nther Leising",

year = "1998",

language = "English",

volume = "409",

pages = "302--306",

journal = "Surface Science",

issn = "1879-2758",

publisher = "Elsevier B.V.",

number = "2",

}