In situ investigations in the ESEM Advances in materials science

Armin Zankel; Angelika Reichmann; Peter Pölt

doi:10.3217/978-3-85125-062-6-640

In situ investigations in the ESEM Advances in materials science

Armin Zankel, Angelika Reichmann, Peter Pölt

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Materials Science
Place of Publication	Wien
Publisher	Facultas
Pages	535-536
ISBN (Print)	978-3-85125-062-6
DOIs	https://doi.org/10.3217/978-3-85125-062-6-640
Publication status	Published - 2009
Event	Multinational Congress on Microscopy - Graz, Austria Duration: 30 Aug 2009 → 4 Sept 2009

Publication series

Name	Materials Science
Publisher	Facultas

Conference

Conference	Multinational Congress on Microscopy
Country/Territory	Austria
City	Graz
Period	30/08/09 → 4/09/09

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Access to Document

10.3217/978-3-85125-062-6-640

Microanalysis and in-situ studies using scanning electron microscopy
1/01/01 → 14/05/20
Project: Research area

Cite this

@inproceedings{76979a18ae524892a08f4ef2f8028d46,

title = "In situ investigations in the ESEM Advances in materials science",

author = "Armin Zankel and Angelika Reichmann and Peter P{\"o}lt",

year = "2009",

doi = "10.3217/978-3-85125-062-6-640",

language = "English",

isbn = "978-3-85125-062-6",

series = "Materials Science",

publisher = "Facultas",

pages = "535--536",

booktitle = "Materials Science",

note = "Multinational Congress on Microscopy ; Conference date: 30-08-2009 Through 04-09-2009",

}

TY - GEN

T1 - In situ investigations in the ESEM Advances in materials science

AU - Zankel, Armin

AU - Reichmann, Angelika

AU - Pölt, Peter

PY - 2009

Y1 - 2009

U2 - 10.3217/978-3-85125-062-6-640

DO - 10.3217/978-3-85125-062-6-640

M3 - Conference paper

SN - 978-3-85125-062-6

T3 - Materials Science

SP - 535

EP - 536

BT - Materials Science

PB - Facultas

CY - Wien

T2 - Multinational Congress on Microscopy

Y2 - 30 August 2009 through 4 September 2009

ER -

In situ investigations in the ESEM Advances in materials science

Publication series

Conference

Treatment code (Nähere Zuordnung)

Access to Document

Projects

Microanalysis and in-situ studies using scanning electron microscopy

Cite this