Abstract
The position of an object’s edge can be
determined from its shadow projected onto a CCD or
CMOS sensor without any additional optical elements
such as lenses. Nevertheless, in many applications a
collimated Laser light beam is used to illuminate the
measured object. Since laser diodes are often
complicated in handling, and mostly need additional
expensive Laser driver hardware, new approaches
were considered. Spatially extended light sources such
as off-the-shelf LEDs could be used for edge detection
in combination with diffraction pattern analysis,
without the need of any additional collimation optics
for illumination. Results and applicability for simple
position measurement are discussed.
determined from its shadow projected onto a CCD or
CMOS sensor without any additional optical elements
such as lenses. Nevertheless, in many applications a
collimated Laser light beam is used to illuminate the
measured object. Since laser diodes are often
complicated in handling, and mostly need additional
expensive Laser driver hardware, new approaches
were considered. Spatially extended light sources such
as off-the-shelf LEDs could be used for edge detection
in combination with diffraction pattern analysis,
without the need of any additional collimation optics
for illumination. Results and applicability for simple
position measurement are discussed.
Original language | English |
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Title of host publication | Proceedings of the 21ST IMEKO TC-4 INTERNATIONAL SYMPOSIUM ON UNDERSTANDING THE WORLD THROUGH ELECTRICAL AND ELECTRONIC MEASUREMENT, and 19TH INTERNATIONAL WORKSHOP ON ADC MODELLING AND TESTING |
Pages | 134-139 |
Number of pages | 6 |
Publication status | Published - 7 Sept 2016 |
Event | 21ST IMEKO TC-4 INTERNATIONAL SYMPOSIUM ON UNDERSTANDING THE WORLD THROUGH ELECTRICAL AND ELECTRONIC MEASUREMENT - Budapest, Hungary Duration: 7 Sept 2016 → 9 Sept 2016 |
Conference
Conference | 21ST IMEKO TC-4 INTERNATIONAL SYMPOSIUM ON UNDERSTANDING THE WORLD THROUGH ELECTRICAL AND ELECTRONIC MEASUREMENT |
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Country/Territory | Hungary |
City | Budapest |
Period | 7/09/16 → 9/09/16 |
Keywords
- CCD Sensor
- Knife Edge Diffraction