Latch-up Detection During ESD Soft Failure Characterization Using an On-Die Power Sensor

Giorgi Maghlakelidze, Harald Gossner, David Johannes Pommerenke

Research output: Contribution to journalArticlepeer-review


ESD-induced latch up is detected with an on-die energy counter circuit. Raw values are accessed through a Linux operating system kernel call, then the power consumption is calculated. Persistent power consumption increase indicates the latch-up occurrence, thus avoiding the need of external equipment for its detection. The failure mode is not visually noticeable and requires full power cycling to fully recover
Original languageEnglish
Pages (from-to)67-71
JournalIEEE Letters on Electromagnetic Compatibility Practice and Applications
Issue number3
Publication statusPublished - 2019
Externally publishedYes

Cite this