TY - JOUR
T1 - Mechanism and Validation of USB 3.0 Connector Caused Radio Frequency Interference
AU - Sun, Yin
AU - Lin, Hank
AU - Tseng, Bin-Chyi
AU - Pommerenke, David Johannes
AU - Hwang, Chulsoon
PY - 2020/8
Y1 - 2020/8
N2 - The mechanism of a universal serial bus 3.0 connector caused radio frequency interference (RFI) to a nearby antenna is studied. The connector radiation is modeled by an equivalent stripline-fed slot antenna, based on the analysis of the common mode current path on the connector structure. With the proposed connector model, the original connector radiation source can be replaced by an equivalent magnetic dipole source, which is directly correlated with the physical quantity on the connector. Applying reciprocity theorem, the equivalent dipole source can be applied to predict the coupled noise power to the antenna. The proposed connector radiation mechanism and model are validated through full-wave simulation and measurement. The application of the magnetic dipole source for RFI estimation is demonstrated in a real laptop system.
AB - The mechanism of a universal serial bus 3.0 connector caused radio frequency interference (RFI) to a nearby antenna is studied. The connector radiation is modeled by an equivalent stripline-fed slot antenna, based on the analysis of the common mode current path on the connector structure. With the proposed connector model, the original connector radiation source can be replaced by an equivalent magnetic dipole source, which is directly correlated with the physical quantity on the connector. Applying reciprocity theorem, the equivalent dipole source can be applied to predict the coupled noise power to the antenna. The proposed connector radiation mechanism and model are validated through full-wave simulation and measurement. The application of the magnetic dipole source for RFI estimation is demonstrated in a real laptop system.
U2 - 10.1109/TEMC.2019.2925935
DO - 10.1109/TEMC.2019.2925935
M3 - Article
SN - 0018-9375
VL - 62
SP - 1169
EP - 1178
JO - IEEE Transactions on Electromagnetic Compatibility
JF - IEEE Transactions on Electromagnetic Compatibility
IS - 4
ER -