Metrology & methodology of system level ESD testing

D. Lin*, D. Pommerenke, J. Barth, L. G. Henry, H. Hyatt, M. Hopkins, G. Senko, D. Smith

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review


Parameters which cause the poor reproducibility of system level ESD tests have been identified: simulator calibration methodology and insufficient simulator specifications. Results of round robin tests we performed at three laboratories are reported. A better calibration methodology for ESD current measurement and additional simulator specifications for output current and radiated fields are proposed.

Original languageEnglish
Pages (from-to)29-39
Number of pages11
JournalElectrical Overstress Electrostatic Discharge Symposium Proceedings
Publication statusPublished - 1 Dec 1998
Externally publishedYes
Event20th Annual Electrical Overstress/Electrostatic Discharge Symposium: EOS/ESD 1998 - Reno, United States
Duration: 6 Oct 19988 Oct 1998

ASJC Scopus subject areas

  • Condensed Matter Physics


Dive into the research topics of 'Metrology & methodology of system level ESD testing'. Together they form a unique fingerprint.

Cite this