Metrology & methodology of system level ESD testing

D. Lin; D. Pommerenke; J. Barth; L. G. Henry; H. Hyatt; M. Hopkins; G. Senko; D. Smith

Metrology & methodology of system level ESD testing

D. Lin^*, D. Pommerenke, J. Barth, L. G. Henry, H. Hyatt, M. Hopkins, G. Senko, D. Smith

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

Abstract

Parameters which cause the poor reproducibility of system level ESD tests have been identified: simulator calibration methodology and insufficient simulator specifications. Results of round robin tests we performed at three laboratories are reported. A better calibration methodology for ESD current measurement and additional simulator specifications for output current and radiated fields are proposed.

Original language	English
Pages (from-to)	29-39
Number of pages	11
Journal	Electrical Overstress Electrostatic Discharge Symposium Proceedings
Publication status	Published - 1 Dec 1998
Externally published	Yes
Event	20th Annual Electrical Overstress/Electrostatic Discharge Symposium: EOS/ESD 1998 - Reno, United States Duration: 6 Oct 1998 → 8 Oct 1998

ASJC Scopus subject areas

Condensed Matter Physics

Cite this

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title = "Metrology & methodology of system level ESD testing",

abstract = "Parameters which cause the poor reproducibility of system level ESD tests have been identified: simulator calibration methodology and insufficient simulator specifications. Results of round robin tests we performed at three laboratories are reported. A better calibration methodology for ESD current measurement and additional simulator specifications for output current and radiated fields are proposed.",

author = "D. Lin and D. Pommerenke and J. Barth and Henry, {L. G.} and H. Hyatt and M. Hopkins and G. Senko and D. Smith",

year = "1998",

month = dec,

day = "1",

language = "English",

pages = "29--39",

journal = "Electrical Overstress Electrostatic Discharge Symposium Proceedings",

issn = "0739-5159",

publisher = "Reliability Analysis Center ",

note = "20th Annual Electrical Overstress/Electrostatic Discharge Symposium : EOS/ESD 1998 ; Conference date: 06-10-1998 Through 08-10-1998",

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TY - JOUR

T1 - Metrology & methodology of system level ESD testing

AU - Lin, D.

AU - Pommerenke, D.

AU - Barth, J.

AU - Henry, L. G.

AU - Hyatt, H.

AU - Hopkins, M.

AU - Senko, G.

AU - Smith, D.

PY - 1998/12/1

Y1 - 1998/12/1

N2 - Parameters which cause the poor reproducibility of system level ESD tests have been identified: simulator calibration methodology and insufficient simulator specifications. Results of round robin tests we performed at three laboratories are reported. A better calibration methodology for ESD current measurement and additional simulator specifications for output current and radiated fields are proposed.

AB - Parameters which cause the poor reproducibility of system level ESD tests have been identified: simulator calibration methodology and insufficient simulator specifications. Results of round robin tests we performed at three laboratories are reported. A better calibration methodology for ESD current measurement and additional simulator specifications for output current and radiated fields are proposed.

UR - http://www.scopus.com/inward/record.url?scp=0032312442&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0032312442

SN - 0739-5159

SP - 29

EP - 39

JO - Electrical Overstress Electrostatic Discharge Symposium Proceedings

JF - Electrical Overstress Electrostatic Discharge Symposium Proceedings

T2 - 20th Annual Electrical Overstress/Electrostatic Discharge Symposium

Y2 - 6 October 1998 through 8 October 1998

ER -

Metrology & methodology of system level ESD testing

Abstract

ASJC Scopus subject areas

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