Parameters which cause the poor reproducibility of system level ESD tests have been identified: simulator calibration methodology and insufficient simulator specifications. Results of round robin tests we performed at three laboratories are reported. A better calibration methodology for ESD current measurement and additional simulator specifications for output current and radiated fields are proposed.
|Number of pages
|Electrical Overstress Electrostatic Discharge Symposium Proceedings
|Published - 1 Dec 1998
|20th Annual Electrical Overstress/Electrostatic Discharge Symposium: EOS/ESD 1998 - Reno, United States
Duration: 6 Oct 1998 → 8 Oct 1998
ASJC Scopus subject areas
- Condensed Matter Physics