Model for ESD LCD upset of a portable product

Jiang Xiao*, David Pommerenke, Fan Zhou, James L. Drewniak, Hideki Shumiya, Takashi Yamada, Kenji Araki

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review


A hybrid method is developed to model Electro-Static Discharge (ESD) LCD (Liquid Crystal Display) upset in a portable product. It combines ESD scanning, full-wave simulation and circuit simulation. This methodology is applied in the investigation of system-level ESD problem of the LCD of the portable product by the following steps. First, the sensitive area of the portable product causing the failure is located by ESD scanning. Using the local injection measurement currents, a behavioural SPICE model is then developed to simulate the ESD failure. Third, a full wave block-level model is used to extract the current densities at the sensitive regions; those current densities are imported into the SPICE model to predict ESD upset levels. The combined model is verified by testing its ability to simulate the upset level of four system level ESD test conditions, leading to satisfactory results.

Original languageEnglish
Title of host publicationIEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program
Number of pages5
Publication statusPublished - 1 Dec 2010
Externally publishedYes
Event2010 IEEE International Symposium on Electromagnetic Compatibility: EMC 2010 - Fort Lauderdale, United States
Duration: 25 Jul 201030 Jul 2010

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076


Conference2010 IEEE International Symposium on Electromagnetic Compatibility
Country/TerritoryUnited States
CityFort Lauderdale


  • ESD
  • Hybrid method
  • LCD
  • Soft-error

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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