Near Field Measurements to Predict the Electromagnetic Emission of Integrated Circuits

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	International Workshop on Electromagnetic Compatibility of Integrated Circuits
Publisher	.
Pages	27-32
Publication status	Published - 2005

Fields of Expertise

@inproceedings{6928341a3c894170b79ab0d8508160c5,

title = "Near Field Measurements to Predict the Electromagnetic Emission of Integrated Circuits",

author = "Bernd Deutschmann and H. Pitsch and G. Langer",

year = "2005",

language = "English",

pages = "27--32",

booktitle = "International Workshop on Electromagnetic Compatibility of Integrated Circuits",

publisher = ".",

}