On the Effects of Transient Electromagnetic Interference on Integrated Circuits

Bernd Deutschmann, Etienne Sicard, Sonia Ben Dhia

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	16-24
Journal	Electronic Device Failure Analysis
Volume	8
Issue number	4
Publication status	Published - 2006

Fields of Expertise

@article{c24e23f5e7054c7088da00ef3b51ba72,

title = "On the Effects of Transient Electromagnetic Interference on Integrated Circuits",

author = "Bernd Deutschmann and Etienne Sicard and {Ben Dhia}, Sonia",

year = "2006",

language = "English",

volume = "8",

pages = "16--24",

journal = "Electronic Device Failure Analysis",

issn = "1537-0755",

publisher = "ASM International",

number = "4",

}