Photo-Patterned SAMs on Au(111) and SiOx: An XPS Investigation

Anna Maria Track; Alexander Lex; Thomas Höfler; Thomas Grießer; Peter Pacher; Heinz-Georg Flesch; Gregor Hlawacek; Robert Schennach; Gregor Trimmel; Wolfgang Kern; Georg Koller; Michael G. Ramsey

Photo-Patterned SAMs on Au(111) and SiOx: An XPS Investigation

Anna Maria Track, Alexander Lex, Thomas Höfler, Thomas Grießer, Peter Pacher, Heinz-Georg Flesch, Gregor Hlawacek, Robert Schennach, Gregor Trimmel, Wolfgang Kern, Georg Koller, Michael G. Ramsey

Research output: Contribution to conference › (Old data) Lecture or Presentation

Original language	English
Publication status	Published - 19 Oct 2008
Event	AVS 55th International Symposium - Boston, United States Duration: 19 Oct 2008 → 24 Oct 2008

Conference

Conference	AVS 55th International Symposium
Country/Territory	United States
City	Boston
Period	19/10/08 → 24/10/08

Treatment code (Nähere Zuordnung)

Experimental

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2008_AVS_abstract_Track.pdfFinal published version, 9.48 KB

Cite this

@conference{27993e6e926048609b012f58282f8d68,

title = "Photo-Patterned SAMs on Au(111) and SiOx: An XPS Investigation",

author = "Track, {Anna Maria} and Alexander Lex and Thomas H{\"o}fler and Thomas Grie{\ss}er and Peter Pacher and Heinz-Georg Flesch and Gregor Hlawacek and Robert Schennach and Gregor Trimmel and Wolfgang Kern and Georg Koller and Ramsey, {Michael G.}",

year = "2008",

month = oct,

day = "19",

language = "English",

note = "AVS 55th International Symposium ; Conference date: 19-10-2008 Through 24-10-2008",

}

TY - CONF

T1 - Photo-Patterned SAMs on Au(111) and SiOx: An XPS Investigation

AU - Track, Anna Maria

AU - Lex, Alexander

AU - Höfler, Thomas

AU - Grießer, Thomas

AU - Pacher, Peter

AU - Flesch, Heinz-Georg

AU - Hlawacek, Gregor

AU - Schennach, Robert

AU - Trimmel, Gregor

AU - Kern, Wolfgang

AU - Koller, Georg

AU - Ramsey, Michael G.

PY - 2008/10/19

Y1 - 2008/10/19

UR - http://www2.avs.org/symposium/AVS55/pages/info.html

M3 - (Old data) Lecture or Presentation

T2 - AVS 55th International Symposium

Y2 - 19 October 2008 through 24 October 2008

ER -

Photo-Patterned SAMs on Au(111) and SiOx: An XPS Investigation

Conference

Treatment code (Nähere Zuordnung)

Access to Document

Other files and links

Cite this