Pin specific ESD soft failure characterization using a fully automated set-up

Giorgi Maghlakelidze, Pengyu Wei, Wei Huang, Harald Gossner, David Pommerenke

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review


A fully automated system is developed for the systematic characterization of soft failure robustness for a DUT. The methodology is founded on software-based detection methods and applied to a USB3 interface. The approach is extendable to other interfaces and measurement-based failure detection methods.

Original languageEnglish
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018
PublisherESD Association
ISBN (Electronic)1585373028
Publication statusPublished - 25 Oct 2018
Externally publishedYes
Event40th Annual Electrical Overstress/Electrostatic Discharge Symposium: EOS/ESD 2018 - Reno, United States
Duration: 23 Sept 201828 Sept 2018

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
ISSN (Print)0739-5159


Conference40th Annual Electrical Overstress/Electrostatic Discharge Symposium
Country/TerritoryUnited States

ASJC Scopus subject areas

  • Electrical and Electronic Engineering


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