@inproceedings{1acacc5d28ea45b498a152e1c3e06295,
title = "Race conditions among protection devices for a high speed I/O interface",
abstract = "–The ESD coupling path and on-board impedances strongly affect the ESD rise time seen on a PCB trace. Possible race conditions between external and on-die ESD protection were studied using measurement-based models of the transient response and on-board passives. Results show the interplay of rise time and protection turn-on can prevent the external TVS from responding in time.",
author = "Jianchi Zhou and Javad Meiguni and Sergej Bub and Steffen Holland and Guido Notermans and Yang Xu and Giorgi Maghlakelidze and David Pommerenke and Daryl Beetner",
year = "2020",
month = sep,
day = "13",
language = "English",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
publisher = "ESD Association",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium 2020, Proceedings - EOS/ESD 2020",
note = "42nd Annual Electrical Overstress/Electrostatic Discharge Symposium : EOS/ESD 2020, EOS/ESD 2020 ; Conference date: 13-09-2020 Through 18-09-2020",
}