Raman Imaging and Scanning Electron Microscopy (RISE) combined with EDX: correlativemicroscopy for different fields of science and technology

Armin Zankel

Raman Imaging and Scanning Electron Microscopy (RISE) combined with EDX: correlativemicroscopy for different fields of science and technology

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper

Original language	English
Title of host publication	Program MC2019/Mini lunchtime lecture: Carl Zeiss Microscopy GmbH
Pages	62
Volume	Program
Publication status	Published - 2019
Event	Microscopy Conference 2019 : MC19 - Berlin, Germany Duration: 1 Sept 2019 → 6 Sept 2019

Conference

Conference	Microscopy Conference 2019
Abbreviated title	MC 2019
Country/Territory	Germany
City	Berlin
Period	1/09/19 → 6/09/19

ASJC Scopus subject areas

Materials Science(all)

Fields of Expertise

Advanced Materials Science

Cite this

@inproceedings{468573bc1b624e98a915782f45e7fab9,

title = "Raman Imaging and Scanning Electron Microscopy (RISE) combined with EDX: correlativemicroscopy for different fields of science and technology",

author = "Armin Zankel",

year = "2019",

language = "English",

volume = "Program",

pages = "62",

booktitle = "Program MC2019/Mini lunchtime lecture: Carl Zeiss Microscopy GmbH",

note = "Microscopy Conference 2019 : MC19, MC 2019 ; Conference date: 01-09-2019 Through 06-09-2019",

}

TY - GEN

T1 - Raman Imaging and Scanning Electron Microscopy (RISE) combined with EDX: correlativemicroscopy for different fields of science and technology

AU - Zankel, Armin

PY - 2019

Y1 - 2019

M3 - Conference paper

VL - Program

SP - 62

BT - Program MC2019/Mini lunchtime lecture: Carl Zeiss Microscopy GmbH

T2 - Microscopy Conference 2019

Y2 - 1 September 2019 through 6 September 2019

ER -