Side-Channel Leakage Across Borders

Jörn-Marc Schmidt; Thomas Plos; Mario Kirschbaum; Michael Hutter; Marcel Medwed; Christoph Herbst

Side-Channel Leakage Across Borders

Jörn-Marc Schmidt, Thomas Plos, Mario Kirschbaum, Michael Hutter, Marcel Medwed, Christoph Herbst

Institute of Applied Information Processing and Communications (7050)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Smart Card Research and Advanced Applications 9th IFIP WG 8.8/11.2 International Conference, CARDIS 2010
Editors	Dieter Gollmann, Jean-Louis Lanet, Julien Iguchi-Cartigny
Place of Publication	Heidelberg
Publisher	Springer
Pages	36-48
Publication status	Published - 2010
Event	International Conference on Smart Card Research and Advanced Applications - Passau, Germany Duration: 14 Apr 2010 → 16 Apr 2010

Publication series

Name	LNCS
Publisher	Springer

Conference

Conference	International Conference on Smart Card Research and Advanced Applications
Country/Territory	Germany
City	Passau
Period	14/04/10 → 16/04/10

Fields of Expertise

Information, Communication & Computing

Treatment code (Nähere Zuordnung)

Application
Experimental

POWER TRUST - Low POWer & Energy Relevant techniques Targetting Robust Universal Security in deep sub-micron Technologies
Kirschbaum, M., Medwed, M., Szekely, A., Tillich, S., Dominikus, S., Herbst, C. & Aigner, M. J.
1/03/08 → 31/12/10
Project: Research project
IMPA Lab
Posch, R., Rijmen, V., Posch, K., Kirschbaum, M., Schmidt, J., Schläffer, M., Szekely, A., Medwed, M., Plos, T., Peßl, P., Aigner, M. J., Wenger, E., Dominikus, S., Feldhofer, M., Hutter, M. & Oswald, M. E.
1/10/99 → 15/07/19
Project: Research area

Cite this

Side-Channel Leakage Across Borders. / Schmidt, Jörn-Marc; Plos, Thomas; Kirschbaum, Mario et al.
Smart Card Research and Advanced Applications 9th IFIP WG 8.8/11.2 International Conference, CARDIS 2010. ed. / Dieter Gollmann; Jean-Louis Lanet; Julien Iguchi-Cartigny. Heidelberg: Springer, 2010. p. 36-48 (LNCS).

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Schmidt, J-M, Plos, T, Kirschbaum, M, Hutter, M, Medwed, M & Herbst, C 2010, Side-Channel Leakage Across Borders. in D Gollmann, J-L Lanet & J Iguchi-Cartigny (eds), Smart Card Research and Advanced Applications 9th IFIP WG 8.8/11.2 International Conference, CARDIS 2010. LNCS, Springer, Heidelberg, pp. 36-48, International Conference on Smart Card Research and Advanced Applications, Passau, Germany, 14/04/10.

@inproceedings{2fc9e764fb064d0fae3afcc8eda79774,

title = "Side-Channel Leakage Across Borders",

author = "J{\"o}rn-Marc Schmidt and Thomas Plos and Mario Kirschbaum and Michael Hutter and Marcel Medwed and Christoph Herbst",

year = "2010",

language = "English",

series = "LNCS",

publisher = "Springer",

pages = "36--48",

editor = "Dieter Gollmann and Jean-Louis Lanet and Julien Iguchi-Cartigny",

booktitle = "Smart Card Research and Advanced Applications 9th IFIP WG 8.8/11.2 International Conference, CARDIS 2010",

note = "International Conference on Smart Card Research and Advanced Applications ; Conference date: 14-04-2010 Through 16-04-2010",

}

TY - GEN

T1 - Side-Channel Leakage Across Borders

AU - Schmidt, Jörn-Marc

AU - Plos, Thomas

AU - Kirschbaum, Mario

AU - Hutter, Michael

AU - Medwed, Marcel

AU - Herbst, Christoph

PY - 2010

Y1 - 2010

M3 - Conference paper

T3 - LNCS

SP - 36

EP - 48

BT - Smart Card Research and Advanced Applications 9th IFIP WG 8.8/11.2 International Conference, CARDIS 2010

A2 - Gollmann, Dieter

A2 - Lanet, Jean-Louis

A2 - Iguchi-Cartigny, Julien

PB - Springer

CY - Heidelberg

T2 - International Conference on Smart Card Research and Advanced Applications

Y2 - 14 April 2010 through 16 April 2010

ER -

Side-Channel Leakage Across Borders

Publication series

Conference

Fields of Expertise

Treatment code (Nähere Zuordnung)

Projects

POWER TRUST - Low POWer & Energy Relevant techniques Targetting Robust Universal Security in deep sub-micron Technologies

IMPA Lab

Cite this