Standards for Analysis of Submicron Particles by SEM/EDXS

Mario Schmied, Peter Pölt, Jonas Dahl

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	European Congress on Electron Microscopy
Publisher	Czechoslovak Society for Electron Microscopy
Pages	287-288
ISBN (Print)	80-2385503-4
Publication status	Published - 2000
Event	European Congress on Electron Microscopy - Brno, Czech Republic Duration: 9 Jul 2000 → 14 Jul 2000

Conference	European Congress on Electron Microscopy
Country/Territory	Czech Republic
City	Brno
Period	9/07/00 → 14/07/00

Treatment code (Nähere Zuordnung)

@inproceedings{0425283e40a94857b4e7e3fcdca33c15,

title = "Standards for Analysis of Submicron Particles by SEM/EDXS",

author = "Mario Schmied and Peter P{\"o}lt and Jonas Dahl",

year = "2000",

language = "English",

isbn = "80-2385503-4",

pages = "287--288",

booktitle = "European Congress on Electron Microscopy",

publisher = "Czechoslovak Society for Electron Microscopy",

note = "European Congress on Electron Microscopy ; Conference date: 09-07-2000 Through 14-07-2000",

}

TY - GEN

T1 - Standards for Analysis of Submicron Particles by SEM/EDXS

AU - Schmied, Mario

AU - Pölt, Peter

AU - Dahl, Jonas

PY - 2000

Y1 - 2000

M3 - Conference paper

SN - 80-2385503-4

SP - 287

EP - 288

BT - European Congress on Electron Microscopy

PB - Czechoslovak Society for Electron Microscopy

T2 - European Congress on Electron Microscopy

Y2 - 9 July 2000 through 14 July 2000

ER -