Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM

Alfred Neuhold, Stefanie Fladischer, Stefan Mitsche, Armin Moser, Heinz-Georg Flesch, Jiri Novak, Elke Kraker, Anja Haase, Detlef M. Smilgies, Werner Grogger, Roland Resel

Research output: Contribution to conferencePoster

Original languageGerman
Publication statusPublished - 2010
EventISOTEC Meeting 2010 - Reinischkogel
Duration: 25 Nov 201026 Nov 2010


ConferenceISOTEC Meeting 2010

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