Universal Pressure Scanning Electron Microscopy: Pushing the Limits of Environmental Scanning Electron Microscopy

Research output: Contribution to journalArticle


Recent publications on high pressure capabilities of state of the art environmental scanning electron microscopes have shown that they are working far away from physical limits and that there is plenty of room for improvements. In this publication an optimized pressure limiting aperture holder and secondary electron detection system is presented which pushes the limits. Imaging at higher chamber pressures up to one atmosphere investigations of living organisms and much more are possible.
Original languageEnglish
Pages (from-to)38-40
JournalImaging & Microscopy
Issue number2
Publication statusPublished - Jun 2018

ASJC Scopus subject areas

  • Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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