Abstract
An apparatus and a method for the calibrated determination of partial capacitances of capacitive sensors with a plurality of partial capacitances (Ci), having a signal source (SG) whose output signal can be selectively supplied to the individual electrodes (T1, T2) of a sensor, having an amplifier arrangement (AMP, DEM) for measurement signals (SE) which are tapped off at at least one electrode (E1), and having a non-volatile memory (NVM), wherein the control and evaluation circuit (STG) and the computation circuit (RS) are set up to record measured values (Y?i) in a calibration phase, wherein the relative capacitance values (c?i) for each pair of electrodes are known for at least two measurements, to store these measured values (Y?i) or values derived therefrom in the non-volatile memory (NVM), and, in a subsequent measuring phase, to record measured values (YMi) in a first step, to use them, in a further step, to determine a proportionality factor (k) using at least one relative capacitance value (cmj), and, in a further step, to use the measured values (YMi,), the proportionality factor (k) and the values (Yki) from the non-volatile memory or variables derived from said values to determine the relative capacitance values (cmi).
Translated title of the contribution | METHOD AND APPARATUS FOR DETERMINING CAPACITANCE VALUES OF CAPACITIVE SENSORS |
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Original language | German |
Patent number | WO2009015404 |
IPC | G01D 5/ 24 A I |
Priority date | 1/08/07 |
Publication status | Published - 5 Feb 2009 |