Voltage Dependence and Characterization of Ceramic Capacitors Under Electrical Stress

Michael Fuchs, Markus Sievers, Bernd Deutschmann

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review


This paper covers the effects of multi-layer ceramic capacitors (MLCC) and their frequency response after having been subjected to excessive electrical stress. For this purpose, a measurement system is presented which allows a precise measurement of the impedance curve up to frequencies of 1 GHz with simultaneous application of DC voltages up to 300 V. In addition, the paper presents a stress test system which stresses the capacitors with pulses up to 300 V and 30 A. The study examines the effects of these stress tests on the behavior of the MLCCs. The findings can be used in simulation of electromagnetic emissions where one might need to take the degradation of components due to aging into account.

Translated title of the contributionSpannungsabhängigkeit und Charakterisierung von Keramik-Kondensatoren unter elektrischer Beanspruchung
Original languageEnglish
Title of host publicationAPEC 2020 - 35th Annual IEEE Applied Power Electronics Conference and Exposition
PublisherInstitute of Electrical and Electronics Engineers
Number of pages7
ISBN (Electronic)9781728148298
Publication statusPublished - Mar 2020
Event35th Annual IEEE Applied Power Electronics Conference and Exposition: APEC 2020 - New Orleans, United States
Duration: 15 Mar 202019 Mar 2020


Conference35th Annual IEEE Applied Power Electronics Conference and Exposition
Abbreviated titleAPEC 2020
Country/TerritoryUnited States
CityNew Orleans


  • Accelerated Stress Testing
  • Degradation
  • EMI simulations
  • High Frequency Behavior
  • High Voltage
  • Impedance Characterization
  • MLCC aging
  • Modelling

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Application

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