Abstract
This paper covers the effects of multi-layer ceramic capacitors (MLCC) and their frequency response after having been subjected to excessive electrical stress. For this purpose, a measurement system is presented which allows a precise measurement of the impedance curve up to frequencies of 1 GHz with simultaneous application of DC voltages up to 300 V. In addition, the paper presents a stress test system which stresses the capacitors with pulses up to 300 V and 30 A. The study examines the effects of these stress tests on the behavior of the MLCCs. The findings can be used in simulation of electromagnetic emissions where one might need to take the degradation of components due to aging into account.
Translated title of the contribution | Spannungsabhängigkeit und Charakterisierung von Keramik-Kondensatoren unter elektrischer Beanspruchung |
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Original language | English |
Title of host publication | APEC 2020 - 35th Annual IEEE Applied Power Electronics Conference and Exposition |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 2815-2821 |
Number of pages | 7 |
ISBN (Electronic) | 9781728148298 |
DOIs | |
Publication status | Published - Mar 2020 |
Event | 35th Annual IEEE Applied Power Electronics Conference and Exposition: APEC 2020 - New Orleans, United States Duration: 15 Mar 2020 → 19 Mar 2020 |
Conference
Conference | 35th Annual IEEE Applied Power Electronics Conference and Exposition |
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Abbreviated title | APEC 2020 |
Country/Territory | United States |
City | New Orleans |
Period | 15/03/20 → 19/03/20 |
Keywords
- Accelerated Stress Testing
- Degradation
- EMI simulations
- High Frequency Behavior
- High Voltage
- Impedance Characterization
- MLCC aging
- Modelling
ASJC Scopus subject areas
- Electrical and Electronic Engineering
Fields of Expertise
- Information, Communication & Computing
Treatment code (Nähere Zuordnung)
- Application