Which Components to Blame? Integrating Diagnosis into Monitoring of Technical Systems

Franz Wotawa

doi:10.1007/978-3-031-36822-6_3

Which Components to Blame? Integrating Diagnosis into Monitoring of Technical Systems

Franz Wotawa^*

^*Corresponding author for this work

Institute of Software Technology (7160)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

System monitoring is essential for detecting failures during operation and ensuring reliability. A monitoring system obtains observations and checks their consistency concerning requirements formalized as properties. However, finding property violations does not necessarily mean finding the causes. In this paper, we contribute to the latter and suggest introducing model-based diagnosis for root cause identification. We do this by adding information regarding the source of observations. Furthermore, we suggest implementing properties using ordinary programming languages from which we can obtain a formal model directly. Finally, we explain the process of integrating diagnosis into monitoring and show its value using a case study from the automotive domain.

Original language	English
Title of host publication	Advances and Trends in Artificial Intelligence. Theory and Applications
Subtitle of host publication	36th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2023, Proceedings, Part II
Editors	Hamido Fujita, Yinglin Wang, Yanghua Xiao, Ali Moonis
Place of Publication	Cham
Publisher	Springer Science and Business Media Deutschland GmbH
Pages	33-44
Number of pages	12
ISBN (Electronic)	978-3-031-36822-6
ISBN (Print)	9783031368219
DOIs	https://doi.org/10.1007/978-3-031-36822-6_3
Publication status	Published - 2023
Event	36th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems: IEA/AIE 2023 - Shanghai, Online, China Duration: 19 Jul 2023 → 22 Jul 2023 http://www.ieaaie2023.com

Publication series

Name	Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume	13926 LNAI
ISSN (Print)	0302-9743
ISSN (Electronic)	1611-3349

Conference

Conference	36th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems
Abbreviated title	IEA/AIE 2023
Country/Territory	China
City	Shanghai, Online
Period	19/07/23 → 22/07/23
Internet address	http://www.ieaaie2023.com

Keywords

Explaining deviations
Model-based diagnosis
System monitoring

ASJC Scopus subject areas

Theoretical Computer Science
General Computer Science

Access to Document

10.1007/978-3-031-36822-6_3

Cite this

Wotawa, F. (2023). Which Components to Blame? Integrating Diagnosis into Monitoring of Technical Systems. In H. Fujita, Y. Wang, Y. Xiao, & A. Moonis (Eds.), Advances and Trends in Artificial Intelligence. Theory and Applications: 36th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2023, Proceedings, Part II (pp. 33-44). (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Vol. 13926 LNAI). Springer Science and Business Media Deutschland GmbH. https://doi.org/10.1007/978-3-031-36822-6_3

Which Components to Blame? Integrating Diagnosis into Monitoring of Technical Systems. / Wotawa, Franz.
Advances and Trends in Artificial Intelligence. Theory and Applications: 36th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2023, Proceedings, Part II. ed. / Hamido Fujita; Yinglin Wang; Yanghua Xiao; Ali Moonis. Cham: Springer Science and Business Media Deutschland GmbH, 2023. p. 33-44 (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Vol. 13926 LNAI).

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Wotawa, F 2023, Which Components to Blame? Integrating Diagnosis into Monitoring of Technical Systems. in H Fujita, Y Wang, Y Xiao & A Moonis (eds), Advances and Trends in Artificial Intelligence. Theory and Applications: 36th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2023, Proceedings, Part II. Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), vol. 13926 LNAI, Springer Science and Business Media Deutschland GmbH, Cham, pp. 33-44, 36th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, Shanghai, Online, China, 19/07/23. https://doi.org/10.1007/978-3-031-36822-6_3

Wotawa F. Which Components to Blame? Integrating Diagnosis into Monitoring of Technical Systems. In Fujita H, Wang Y, Xiao Y, Moonis A, editors, Advances and Trends in Artificial Intelligence. Theory and Applications: 36th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2023, Proceedings, Part II. Cham: Springer Science and Business Media Deutschland GmbH. 2023. p. 33-44. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)). doi: 10.1007/978-3-031-36822-6_3

Wotawa, Franz. / Which Components to Blame? Integrating Diagnosis into Monitoring of Technical Systems. Advances and Trends in Artificial Intelligence. Theory and Applications: 36th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2023, Proceedings, Part II. editor / Hamido Fujita ; Yinglin Wang ; Yanghua Xiao ; Ali Moonis. Cham : Springer Science and Business Media Deutschland GmbH, 2023. pp. 33-44 (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)).

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