X-ray sectrometry in SEM and elements of the first transition series

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Electron microscopy and analysis 1999
Place of Publication	Bristol
Publisher	IOP Publishing
Pages	123-126
Volume	161
Publication status	Published - 1999
Event	Institute of Physics Electron Microscopy and Analysis Group Conference - Sheffield, United Kingdom Duration: 24 Aug 1999 → 27 Aug 1999

Name	Institute of Physics conference series
Publisher	IOP Publ.

Conference	Institute of Physics Electron Microscopy and Analysis Group Conference
Country/Territory	United Kingdom
City	Sheffield
Period	24/08/99 → 27/08/99

Treatment code (Nähere Zuordnung)

@inproceedings{4b68ec15b89145d8bcb00907eeb91aea,

title = "X-ray sectrometry in SEM and elements of the first transition series",

author = "Peter P{\"o}lt",

year = "1999",

language = "English",

volume = "161",

series = "Institute of Physics conference series",

publisher = "IOP Publishing",

pages = "123--126",

booktitle = "Electron microscopy and analysis 1999",

note = "Institute of Physics Electron Microscopy and Analysis Group Conference ; Conference date: 24-08-1999 Through 27-08-1999",

}

TY - GEN

T1 - X-ray sectrometry in SEM and elements of the first transition series

AU - Pölt, Peter

PY - 1999

Y1 - 1999

M3 - Conference paper

VL - 161

T3 - Institute of Physics conference series

SP - 123

EP - 126

BT - Electron microscopy and analysis 1999

PB - IOP Publishing

CY - Bristol

T2 - Institute of Physics Electron Microscopy and Analysis Group Conference

Y2 - 24 August 1999 through 27 August 1999

ER -