Engineering
Application Specific Integrated Circuit
25%
Defects
25%
Doping Level
25%
Dose Level
25%
Dose Rate
50%
Electric Field
25%
Energy Distribution
25%
Exposure Time
25%
Gamma Ray
25%
Gate Stack
50%
High Dielectric Constant
25%
Integrated Circuit
50%
Ionizing Radiation
100%
Nanoscale
100%
Narrow Channel
25%
Nodes
75%
Optical Lithography
25%
Radiation Effect
100%
Rate Sensitivity
25%
Ray Radiation
25%
Reliability Issue
25%
Semiconductor Device
25%
Side Wall
25%
Silicon Oxide
25%
Size Shrinking
25%
Spatial Distribution
25%
Successful Start
25%
Test Circuit
25%
Test Structure
50%
Material Science
Advanced Material
25%
Annealing
16%
Charge Trapping
66%
Density
41%
Dielectric Material
25%
Electrical Property
25%
Electronic Circuit
75%
Metal-Oxide-Semiconductor Field-Effect Transistor
100%
Novel Material
25%
Oxide Compound
16%
Permittivity
41%
Radiation Damage
16%
Semiconductor Device
16%
Silicon
16%
Silicon Dioxide
25%
Transistor
100%
Physics
Ionizing Radiation
50%
Nanoscale
25%
Photolithography
25%
Radiation Effect
25%
Silica
25%
Silicon Dioxide
25%
Silicon Oxide
25%
Spatial Distribution
25%