Phase segregation in NiAu-nanoalloys induced by swift electrons

Daniel Knez; Martin Schnedlitz; Maximilian Ingo Lasserus; Andreas Hauser; Wolfgang E. Ernst; Ferdinand Hofer; Gerald Kothleitner

Phase segregation in NiAu-nanoalloys induced by swift electrons

Daniel Knez, Martin Schnedlitz, Maximilian Ingo Lasserus, Andreas Hauser, Wolfgang E. Ernst, Ferdinand Hofer, Gerald Kothleitner

Publikation: Konferenzbeitrag › Abstract › Begutachtung

Abstract

With recent advances in aberration corrected electron optics, scanning transmission electron microscopy (STEM) has proven its excellent capability of characterising nanomaterials. In principle, with STEM chemical information can be extracted at the level of individual atoms. Due to the high current densities occurring in a highly focused electron beam, however, interpretation of STEM data is often impeded by continuous beam induced sample changes. This is especially true for systems with a high percentage of weakly bound surface or interface atoms, which is characteristic for nanoscaled materials

Originalsprache	englisch
Seiten	1100
Publikationsstatus	Veröffentlicht - 2020
Veranstaltung	Virtual Early Career European Microscopy Congress 2020: EMC 2020 - Virtuell, Großbritannien / Vereinigtes Königreich Dauer: 24 Nov. 2020 → 26 Nov. 2020 https://www.emc2020.eu/virtual-conference/conference-programme.html

Konferenz

Konferenz	Virtual Early Career European Microscopy Congress 2020
Kurztitel	EMC 2020
Land/Gebiet	Großbritannien / Vereinigtes Königreich
Zeitraum	24/11/20 → 26/11/20
Internetadresse	https://www.emc2020.eu/virtual-conference/conference-programme.html

ASJC Scopus subject areas

Allgemeine Materialwissenschaften

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Dieses zitieren

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title = "Phase segregation in NiAu-nanoalloys induced by swift electrons",

abstract = "With recent advances in aberration corrected electron optics, scanning transmission electron microscopy (STEM) has proven its excellent capability of characterising nanomaterials. In principle, with STEM chemical information can be extracted at the level of individual atoms. Due to the high current densities occurring in a highly focused electron beam, however, interpretation of STEM data is often impeded by continuous beam induced sample changes. This is especially true for systems with a high percentage of weakly bound surface or interface atoms, which is characteristic for nanoscaled materials",

author = "Daniel Knez and Martin Schnedlitz and Lasserus, {Maximilian Ingo} and Andreas Hauser and Ernst, {Wolfgang E.} and Ferdinand Hofer and Gerald Kothleitner",

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TY - CONF

T1 - Phase segregation in NiAu-nanoalloys induced by swift electrons

AU - Knez, Daniel

AU - Schnedlitz, Martin

AU - Lasserus, Maximilian Ingo

AU - Hauser, Andreas

AU - Ernst, Wolfgang E.

AU - Hofer, Ferdinand

AU - Kothleitner, Gerald

PY - 2020

Y1 - 2020

N2 - With recent advances in aberration corrected electron optics, scanning transmission electron microscopy (STEM) has proven its excellent capability of characterising nanomaterials. In principle, with STEM chemical information can be extracted at the level of individual atoms. Due to the high current densities occurring in a highly focused electron beam, however, interpretation of STEM data is often impeded by continuous beam induced sample changes. This is especially true for systems with a high percentage of weakly bound surface or interface atoms, which is characteristic for nanoscaled materials

AB - With recent advances in aberration corrected electron optics, scanning transmission electron microscopy (STEM) has proven its excellent capability of characterising nanomaterials. In principle, with STEM chemical information can be extracted at the level of individual atoms. Due to the high current densities occurring in a highly focused electron beam, however, interpretation of STEM data is often impeded by continuous beam induced sample changes. This is especially true for systems with a high percentage of weakly bound surface or interface atoms, which is characteristic for nanoscaled materials

M3 - Abstract

SP - 1100

T2 - Virtual Early Career European Microscopy Congress 2020

Y2 - 24 November 2020 through 26 November 2020

ER -