Phase segregation in NiAu-nanoalloys induced by swift electrons

Daniel Knez, Martin Schnedlitz, Maximilian Ingo Lasserus, Andreas Hauser, Wolfgang E. Ernst, Ferdinand Hofer, Gerald Kothleitner

Research output: Contribution to conferenceAbstractpeer-review


With recent advances in aberration corrected electron optics, scanning transmission electron microscopy (STEM) has proven its excellent capability of characterising nanomaterials. In principle, with STEM chemical information can be extracted at the level of individual atoms. Due to the high current densities occurring in a highly focused electron beam, however, interpretation of STEM data is often impeded by continuous beam induced sample changes. This is especially true for systems with a high percentage of weakly bound surface or interface atoms, which is characteristic for nanoscaled materials
Original languageEnglish
Publication statusPublished - 2020
EventVirtual Early Career European Microscopy Congress 2020: EMC 2020 - Virtuell, United Kingdom
Duration: 24 Nov 202026 Nov 2020


ConferenceVirtual Early Career European Microscopy Congress 2020
Abbreviated titleEMC 2020
Country/TerritoryUnited Kingdom
Internet address

ASJC Scopus subject areas

  • Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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