Simulation of the Leakage Effect in Capacitive Sensing

Thomas Schlegl, Thomas Bretterklieber, Stephan Mühlbacher-Karrer, Hubert Zangl

Publikation: Beitrag in einer FachzeitschriftArtikelBegutachtung

Abstract

In the measurement of mutual capacitance between electrodes both the coupling and theleakage effect contribute to the measurement result whereas the leakage mode is dominant in the self-capacitance mode. While the coupling effect is mainly defined by the geometry and materialdistribution close to the electrodes, the root cause or modulation of the leakage effect may be far awayfrom the electrode. In this paper we demonstrate that the leakage mode concept allows for simulation of3D problems in 2D. This is useful in applications such as Electrical Capacitance Tomography or objectclassification as it allows simplifying the computational complexity while providing additionalinformation compared to the classical 2D approach.
Originalspracheenglisch
Seiten (von - bis)1579-1594
FachzeitschriftInternational Journal on Smart Sensing and Intelligent Systems
Jahrgang7
Ausgabenummer4
DOIs
PublikationsstatusVeröffentlicht - 2014

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Application
  • Theoretical
  • Experimental

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