Trap-Assisted Memristive Switching in HfO₂-Based Devices Studied by In Situ Soft and Hard X-Ray Photoelectron Spectroscopy

Finn Zahari^*, Richard Marquardt, Matthias Kalläne, Ole Gronenberg, Christoph Schlueter, Yury Matveyev, Georg Haberfehlner, Florian Diekmann, Alena Nierhauve, Jens Buck, Arndt Hanff, Gitanjali Kolhatkar, Gerald Kothleitner, Lorenz Kienle, Martin Ziegler, Jürgen Carstensen, Kai Rossnagel, Hermann Kohlstedt^*