Total ionizing dose effects on MOS transistors fabricated in 0.18 µm CMOS technology

  • Varvara Bezhenova (Speaker)

Activity: Talk or presentation › Poster presentation › Science to science

Period18 May 2016 → 21 May 2016
Event titleAsia-Pacific International Symposium on Electromagnetic Compatibility & Signal Integrity (APEMC)
Event typeConference
LocationShenzhen, ChinaShow on map
Degree of RecognitionInternational

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Radiation

Fields of Expertise

  • Information, Communication & Computing

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