Abstract
Magnetic Force Microscopy (MFM), an advanced mode of Atomic Force Microscopy (AFM), is an often usedand very powerful characterization technology. To induce the magnetic sensitivity, commercial MFM cantilevers mostlyuse non-magnetic standard tips, which are covered with thin magnetic coatings. Such additional layers, however,increase the apex radii, which consequently reduce the lateral resolution capabilities in both, AFM and MFM scans.Furthermore, mechanical stress during scanning can lead to local delamination of the magnetic coating, whichchanges or even removes the magnetic sensitivity. To overcome those issues, a solid, fully magnetic nanoscale tipwould be required, which can be a tough challenge when aiming on full cantilever chips. Following that motivation,we here demonstrate the application of Focused Electron Beam Induced Deposition (FEBID) for additive, direct-write3D-nanoprinting of magnetic tips on pre-finished AFM cantilevers
| Original language | English |
|---|---|
| Pages | 36 |
| Publication status | Published - 2022 |
| Event | 8th FEBIP Workshop of the Focused-Electron-Beam-Induced-Processing: FEBIP 2022 - Krakow, Krakow, Poland Duration: 12 Jul 2022 → 15 Jul 2022 https://acmin.agh.edu.pl/en/febip2022/ |
Conference
| Conference | 8th FEBIP Workshop of the Focused-Electron-Beam-Induced-Processing |
|---|---|
| Abbreviated title | FEBIP 2022 |
| Country/Territory | Poland |
| City | Krakow |
| Period | 12/07/22 → 15/07/22 |
| Internet address |
ASJC Scopus subject areas
- General Materials Science
Fields of Expertise
- Advanced Materials Science
Treatment code (Nähere Zuordnung)
- Basic - Fundamental (Grundlagenforschung)