A Method to Measure the Electromagnetic Emission Induced by Electromagnetic Interference of Integrated Circuits

Daniel Kircher^*, Nikolaus Czepl, Dominik Zupan, Bernd Deutschmann

^*Corresponding author for this work

Institute of Electronics (4390)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

1 Conference or symposium (Participation in/Organisation of)
1 Talk at conference or symposium

2 results
- Title
- Start date(ascending)

A Method to Measure the Electromagnetic Emission Induced by Electromagnetic Interference of Integrated Circuits
Daniel Kircher (Speaker)
24 May 2023
Activity: Talk or presentation › Talk at conference or symposium › Science to science
2023 Joint Asia-Pacific International Symposium on Electromagnetic Compatibility and International Conference on ElectroMagnetic Interference and Compatibility
Daniel Kircher (Participant), Nikolaus Czepl (Participant), Bernd Deutschmann (Participant) & Jan Carsten Hansen (Participant)
22 May 2023 → 25 May 2023
Activity: Participation in or organisation of › Conference or symposium (Participation in/Organisation of)