Activities per year
Abstract
In this paper, we present a method to characterize the electromagnetic emission (EME) of integrated circuits (ICs) caused by electromagnetic interference (EMI). Normally, emission and immunity of ICs are measured separately, but this does not correspond exactly to the application. In reality, an IC always experiences disturbances at its inputs. In order to better illustrate and understand the more realistic measurement of the emission behaviour of an IC, taking into account disturbances on its inputs, we introduce the ELectromagnetic InTerference and Emission (ELITE) plot. The ELITE plot is particularly useful for visually representing the EME caused by EMI, and provides a clear understanding of how the electromagnetic emission changes with the frequency of the interference signal. The method involves applying a disturbance signal in the frequency range 1MHz to 1GHz to one pin of the IC and measuring the EME simultaneously at another IC pin. We demonstrate the use of this method with a smart power high-side switch as an example. We also provide instructions for creating an ELITE plot from measurements using a measurement setup combining the direct power injection (DPI) and 150Ω method.
Original language | English |
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Title of host publication | 2023 Joint Asia-Pacific International Symposium on Electromagnetic Compatibility and International Conference on ElectroMagnetic Interference and Compatibility, APEMC/INCEMIC 2023 |
Publisher | Institute of Electrical and Electronics Engineers |
Number of pages | 4 |
ISBN (Electronic) | 9798350338348 |
DOIs | |
Publication status | E-pub ahead of print - 2023 |
Event | 2023 Joint Asia-Pacific International Symposium on Electromagnetic Compatibility and International Conference on ElectroMagnetic Interference and Compatibility: APEMC/INCEMIC 2023 - Bengaluru, India Duration: 22 May 2023 → 25 May 2023 |
Conference
Conference | 2023 Joint Asia-Pacific International Symposium on Electromagnetic Compatibility and International Conference on ElectroMagnetic Interference and Compatibility |
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Abbreviated title | APEMC/INCEMIC 2023 |
Country/Territory | India |
City | Bengaluru |
Period | 22/05/23 → 25/05/23 |
Keywords
- Combined EMC testing
- Direct Power Injection (DPI)
- Electromagnetic Compatibility (EMC)
- Electromagnetic Interference (EMI)
- ELITE-plot
- Functional Safety (FS)
- IEC 61967
- IEC 62132
- Radio Frequency Interference (RFI)
ASJC Scopus subject areas
- Computer Networks and Communications
- Electrical and Electronic Engineering
- Safety, Risk, Reliability and Quality
- Electronic, Optical and Magnetic Materials
- Instrumentation
- Radiation
Activities
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A Method to Measure the Electromagnetic Emission Induced by Electromagnetic Interference of Integrated Circuits
Daniel Kircher (Speaker)
24 May 2023Activity: Talk or presentation › Talk at conference or symposium › Science to science
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2023 Joint Asia-Pacific International Symposium on Electromagnetic Compatibility and International Conference on ElectroMagnetic Interference and Compatibility
Daniel Kircher (Participant), Nikolaus Czepl (Participant), Bernd Deutschmann (Participant) & Jan Carsten Hansen (Participant)
22 May 2023 → 25 May 2023Activity: Participation in or organisation of › Conference or symposium (Participation in/Organisation of)