Aberration-Corrected STEM Characterisation of Mn-ion Structural Displacements in La0.7Sr0.3MnO3 Interfacial Dead-Layers

P. Rajak, Daniel Knez, Sandeep Kumar Chaluvadi, Pasquale Orgiani, Giorgio Rossi, Laurence Méchin, Regina Ciancio

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Contribution to conference › Abstract › peer-review

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Finished
ESTEEM 3 - Enabling Science and Technology through European Electron Microscopy
Kothleitner, G.
1/01/19 → 31/12/22
Project: Research project