Broadband 3D Modeling and Simulation of DC-Biased SMT Ferrite Beads for EMI Filters

Christian Riener; Thomas Bauernfeind; Klaus Roppert; Samuel Kvasnicka; Bernhard Auinger; Manfred Kaltenbacher

doi:10.1109/EMCEurope57790.2023.10274312

Broadband 3D Modeling and Simulation of DC-Biased SMT Ferrite Beads for EMI Filters

Christian Riener^*, Thomas Bauernfeind, Klaus Roppert, Samuel Kvasnicka, Bernhard Auinger, Manfred Kaltenbacher

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

Electromagnetic interference (EMI) within electronic based systems (EBS) became a fundamental issue that requires dedicated countermeasures e.g. filter structures to avoid unintended system behavior. The sefilters comprise several components including surface-mounted(SMT) devices to suppress unwanted electromagnetic emissions. However, these devices change their behavior due to dispersion-and saturation-effects (ferroelectric-and ferromagnetic-effect), hence applying a DC bias current might lead to a significantly different behavior than intended. The presented methodology allows a broadband characterization of ferrite core materials used in SMT ferrite bead to predict the impact of dispersion-and saturation-effects on impedance behavior of device. The proposed modeling strategy is based on the Kramers-Kronig relation, vector network analyzer (VNA) measurements, and full-wave finite element simulations.The Extracted Material Models are validated for a frequency range from 100 kHz - 1 GHz and DC bias current levels up to 5A.

Original language	English
Title of host publication	2023 International Symposium on Electromagnetic Compatibility - EMC Europe
Publisher	Institute of Electrical and Electronics Engineers
ISBN (Electronic)	9798350324006
DOIs	https://doi.org/10.1109/EMCEurope57790.2023.10274312
Publication status	Published - 2023
Event	2023 International Symposium and Exhibition on Electromagnetic Compatibility: EMC Europe 2023 - Kraków, Poland Duration: 4 Sept 2023 → 8 Sept 2023

Conference

Conference	2023 International Symposium and Exhibition on Electromagnetic Compatibility
Abbreviated title	EMC Europe 2023
Country/Territory	Poland
City	Kraków
Period	4/09/23 → 8/09/23

Keywords

EMIfilters
ferromagneticmaterials
Kramers-Kronigrelation
SMTferritebeads

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/EMCEurope57790.2023.10274312

Cite this

Broadband 3D Modeling and Simulation of DC-Biased SMT Ferrite Beads for EMI Filters. / Riener, Christian; Bauernfeind, Thomas ; Roppert, Klaus et al.
2023 International Symposium on Electromagnetic Compatibility - EMC Europe. Institute of Electrical and Electronics Engineers, 2023.

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Riener, C, Bauernfeind, T , Roppert, K , Kvasnicka, S , Auinger, B & Kaltenbacher, M 2023, Broadband 3D Modeling and Simulation of DC-Biased SMT Ferrite Beads for EMI Filters. in 2023 International Symposium on Electromagnetic Compatibility - EMC Europe. Institute of Electrical and Electronics Engineers, 2023 International Symposium and Exhibition on Electromagnetic Compatibility, Kraków, Poland, 4/09/23. https://doi.org/10.1109/EMCEurope57790.2023.10274312

@inproceedings{7225382fe94442a3a700e7a56edc7889,

title = "Broadband 3D Modeling and Simulation of DC-Biased SMT Ferrite Beads for EMI Filters",

abstract = "Electromagnetic interference (EMI) within electronic based systems (EBS) became a fundamental issue that requires dedicated countermeasures e.g. filter structures to avoid unintended system behavior. The sefilters comprise several components including surface-mounted(SMT) devices to suppress unwanted electromagnetic emissions. However, these devices change their behavior due to dispersion-and saturation-effects (ferroelectric-and ferromagnetic-effect), hence applying a DC bias current might lead to a significantly different behavior than intended. The presented methodology allows a broadband characterization of ferrite core materials used in SMT ferrite bead to predict the impact of dispersion-and saturation-effects on impedance behavior of device. The proposed modeling strategy is based on the Kramers-Kronig relation, vector network analyzer (VNA) measurements, and full-wave finite element simulations.The Extracted Material Models are validated for a frequency range from 100 kHz - 1 GHz and DC bias current levels up to 5A.",

keywords = "EMIfilters, ferromagneticmaterials, Kramers-Kronigrelation, SMTferritebeads",

author = "Christian Riener and Thomas Bauernfeind and Klaus Roppert and Samuel Kvasnicka and Bernhard Auinger and Manfred Kaltenbacher",

note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 2023 International Symposium and Exhibition on Electromagnetic Compatibility : EMC Europe 2023, EMC Europe 2023 ; Conference date: 04-09-2023 Through 08-09-2023",

year = "2023",

doi = "10.1109/EMCEurope57790.2023.10274312",

language = "English",

booktitle = "2023 International Symposium on Electromagnetic Compatibility - EMC Europe",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

}

TY - GEN

T1 - Broadband 3D Modeling and Simulation of DC-Biased SMT Ferrite Beads for EMI Filters

AU - Riener, Christian

AU - Bauernfeind, Thomas

AU - Roppert, Klaus

AU - Kvasnicka, Samuel

AU - Auinger, Bernhard

AU - Kaltenbacher, Manfred

PY - 2023

Y1 - 2023

N2 - Electromagnetic interference (EMI) within electronic based systems (EBS) became a fundamental issue that requires dedicated countermeasures e.g. filter structures to avoid unintended system behavior. The sefilters comprise several components including surface-mounted(SMT) devices to suppress unwanted electromagnetic emissions. However, these devices change their behavior due to dispersion-and saturation-effects (ferroelectric-and ferromagnetic-effect), hence applying a DC bias current might lead to a significantly different behavior than intended. The presented methodology allows a broadband characterization of ferrite core materials used in SMT ferrite bead to predict the impact of dispersion-and saturation-effects on impedance behavior of device. The proposed modeling strategy is based on the Kramers-Kronig relation, vector network analyzer (VNA) measurements, and full-wave finite element simulations.The Extracted Material Models are validated for a frequency range from 100 kHz - 1 GHz and DC bias current levels up to 5A.

AB - Electromagnetic interference (EMI) within electronic based systems (EBS) became a fundamental issue that requires dedicated countermeasures e.g. filter structures to avoid unintended system behavior. The sefilters comprise several components including surface-mounted(SMT) devices to suppress unwanted electromagnetic emissions. However, these devices change their behavior due to dispersion-and saturation-effects (ferroelectric-and ferromagnetic-effect), hence applying a DC bias current might lead to a significantly different behavior than intended. The presented methodology allows a broadband characterization of ferrite core materials used in SMT ferrite bead to predict the impact of dispersion-and saturation-effects on impedance behavior of device. The proposed modeling strategy is based on the Kramers-Kronig relation, vector network analyzer (VNA) measurements, and full-wave finite element simulations.The Extracted Material Models are validated for a frequency range from 100 kHz - 1 GHz and DC bias current levels up to 5A.

KW - EMIfilters

KW - ferromagneticmaterials

KW - Kramers-Kronigrelation

KW - SMTferritebeads

UR - http://www.scopus.com/inward/record.url?scp=85174593754&partnerID=8YFLogxK

U2 - 10.1109/EMCEurope57790.2023.10274312

DO - 10.1109/EMCEurope57790.2023.10274312

M3 - Conference paper

AN - SCOPUS:85174593754

BT - 2023 International Symposium on Electromagnetic Compatibility - EMC Europe

PB - Institute of Electrical and Electronics Engineers

T2 - 2023 International Symposium and Exhibition on Electromagnetic Compatibility

Y2 - 4 September 2023 through 8 September 2023

ER -

Broadband 3D Modeling and Simulation of DC-Biased SMT Ferrite Beads for EMI Filters

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